SP Scientific has announced a line of thermal test enclosures for its ThermoJet
ES precision temperature cycling system. Developed in conjunction with Khoury
Industries, the thermal enclosures provide highly accurate testing and
processing of temperature sensitive electronic products.
Available in either clamshell or hood configurations, SP Scientific
thermal test enclosures may be used to isolate a device under test (DUT) at a
precise temperature insulated from external conditions, thereby providing the
optimal conditions for highly accurate testing. Maintaining a uniform stable
temperature with real-time thermal measurements on a device under test, the new
thermal enclosures deliver unmatched test accuracy and precision. SP
Scientific thermal enclosures allow temperature testing of a variety of device
sizes into almost any test set-up, enabling characterization, qualification,
and fault isolation on components or production level testing. All
thermal test enclosures are electrostatic discharge (ESD)-free and/or
electromagnetic interference (EMI) shielded.
Fully compliant with CE Standards, the ThermoJet ES offers a host of features,
including enhanced data logging capabilities that allow the system to be used
for device characterisation through advanced trending and data analysis. The
system also allows easy data transfer to a PC using a USB Memory Stick.
When partnered with the ThermoJet ES, the thermal enclosures provide engineers
and researchers with an accurate, productive, and flexible tool for thermal
testing or temperature cycling of a wide range of electronic components,
wafers, hybrids, IC's and other devices at precisely controlled temperatures.
The ThermoJet ES and thermal enclosure combination also provides testing of
larger components and DUTs to help increase throughput and productivity, with
temperatures ranging from -80°C to +225°C.
For further information on the ThermoJet ES and the new thermal enclosure
accessory please contact SP Scientific on +1-845-255-5000.
looks good! thanks for the post
ReplyDeleteNew Thermal testing